| |
|
|
White Papers
and
Conference Publications
Analog FastSPICE RF: Full-Spectrum
RF Analyses for Nanometer-scale Integrated Circuits
Description
and
application of periodic
noise, and its
implementation in the AFS Platform
ADC Performance
Signoff with AFS Transient Noise
at Qualcomm
Qualcomm - ADC device noise signoff methodology at with
AFS Transient Noise
Big
Analog/RF Verification: Complex-Block & Full-Circuit
Simulation
Analog,
mixed-signal and RF verification as enabled by the AFS
Platform
Efficient
Noise Analysis for Complex Non-Periodic Analog/RF Blocks
Description and
application of transient
noise, and its
implementation in the AFS Platform
A Robust and Efficient Harmonic
Balance (HB) Using Direct Solution of HB Jacobian
Amit Mehrotra and
Abhishek Somani, DAC
2009, Winner of Best Paper Award
Noise Analysis of
Phase-Locked Loops
Amit Mehrotra, IEEE
Transactions On Circuits And Systems
Analysis of Jitter in
Phase-Locked Loops
David C. Lee, IEEE
Transactions On Circuits And Systems
Precision
Circuit Analysis™ Technology
BDA technology
addresses verification challenges for nanometer CMOS analog/RF
circuits
Application
Articles
Effectively
Analyze PLL Noise And Jitter
Chip Design - BDA
discusses PLL characterization and optimization
Characterizing
Nanometer CMOS PLLs, Sigma-Delta ADCs and AGCs
EETimes - Silicon
Laboratories shares results from analog/RF verification using AFS
Platform
Verify
the design of two-way radio
EETimes -Motorola shares
results from two-way radio verification using AFS Platform
Characterizing
Custom Analog Blocks in Mixed-Signal Microcontrollers
EETimes - Luminary Micro
shares results from analog block verification using AFS
Platform
Datasheets
AFS
Platform: English Japanese
AFS
Nano: English Japanese
|
|
